Detail publikace

Calculation of sensitivities in two-dimmensional electrical impedance tomography

Originální název

Calculation of sensitivities in two-dimmensional electrical impedance tomography

Anglický název

Calculation of sensitivities in two-dimmensional electrical impedance tomography

Jazyk

en

Originální abstrakt

Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.

Anglický abstrakt

Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.

Dokumenty

BibTex


@inproceedings{BUT8442,
  author="Juraj {Valsa} and Jarmila {Dědková} and Libor {Dědek}",
  title="Calculation of sensitivities in two-dimmensional electrical impedance tomography",
  annote="Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.",
  address="Silesian University of Technology",
  booktitle="26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003",
  chapter="8442",
  institution="Silesian University of Technology",
  year="2003",
  month="may",
  pages="43",
  publisher="Silesian University of Technology",
  type="conference paper"
}