Detail publikace

Noise Spectroscopy of Thick Film Resistors

Originální název

Noise Spectroscopy of Thick Film Resistors

Anglický název

Noise Spectroscopy of Thick Film Resistors

Jazyk

en

Originální abstrakt

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

Anglický abstrakt

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

BibTex


@inproceedings{BUT6838,
  author="Vlasta {Sedláková}",
  title="Noise Spectroscopy of Thick Film Resistors",
  annote="The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.",
  address="ÚFYZ FEI VUT Brno",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  chapter="6838",
  institution="ÚFYZ FEI VUT Brno",
  year="2001",
  month="january",
  pages="117",
  publisher="ÚFYZ FEI VUT Brno",
  type="conference paper"
}