Detail publikace
Application of TOF - LEIS and XPS for Surface Studies.
PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.
Originální název
Application of TOF - LEIS and XPS for Surface Studies.
Anglický název
Application of TOF - LEIS and XPS for Surface Studies.
Jazyk
en
Originální abstrakt
In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.
Anglický abstrakt
In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.
Dokumenty
BibTex
@inproceedings{BUT6287,
author="Stanislav {Průša} and Tomáš {Šikola} and Jiří {Spousta} and Stanislav {Voborný} and Petr {Bábor} and Patrik {Jurkovič} and Jan {Čechal}",
title="Application of TOF - LEIS and XPS for Surface Studies.",
annote="In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.",
address="Vutium",
booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
chapter="6287",
institution="Vutium",
year="2001",
month="june",
pages="486",
publisher="Vutium",
type="conference paper"
}