Detail publikace

Application of TOF - LEIS and XPS for Surface Studies.

PRŮŠA, S., ŠIKOLA, T., SPOUSTA, J., VOBORNÝ, S., BÁBOR, P., JURKOVIČ, P., ČECHAL, J.

Originální název

Application of TOF - LEIS and XPS for Surface Studies.

Anglický název

Application of TOF - LEIS and XPS for Surface Studies.

Jazyk

en

Originální abstrakt

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

Anglický abstrakt

In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.

Dokumenty

BibTex 


@inproceedings{BUT6287,
  author="Stanislav {Průša} and Tomáš {Šikola} and Jiří {Spousta} and Stanislav {Voborný} and Petr {Bábor} and Patrik {Jurkovič} and Jan {Čechal}",
  title="Application of TOF - LEIS and XPS for Surface Studies.",
  annote="In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and  ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of  two complementary techniques to surface analysis will be clearly demonstrated.",
  address="Vutium",
  booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
  chapter="6287",
  institution="Vutium",
  year="2001",
  month="june",
  pages="486",
  publisher="Vutium",
  type="conference paper"
}