Detail publikace

Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes

RŮŽIČKA, B., WILFERT, O.

Originální název

Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.

Klíčová slova v angličtině

laser diode, antireflection coating, ECL

Autoři

RŮŽIČKA, B., WILFERT, O.

Rok RIV

2001

Vydáno

10. 5. 2001

Nakladatel

Institute of Radio Electronics, Brno UT

ISBN

80-214-1861-3

Kniha

RADIOELEKTRONIKA 2001

Strany od

286

Strany do

289

Strany počet

4

BibTex

@inproceedings{BUT6277,
  author="Bohdan {Růžička} and Otakar {Wilfert}",
  title="Measurement of Residual Reflectivity and Wavelength of Coated Laser Diodes",
  booktitle="RADIOELEKTRONIKA 2001",
  year="2001",
  pages="4",
  publisher="Institute of Radio Electronics, Brno UT",
  isbn="80-214-1861-3"
}