Detail publikace

Scaling in Analog Circuit Design

Originální název

Scaling in Analog Circuit Design

Anglický název

Scaling in Analog Circuit Design

Jazyk

en

Originální abstrakt

The impact of scaling on the analog performance of CMOS circuits was studied. The solution space for analog scaling was explored between two dimensions: "a standard digital scaling" axis and an "increased bandwidth and dynamic-range" axis. Circuit simulation was applied to explore trends in noise and linearity performance under analog operating conditions at device level and for a basic circuit block. It appears that a single scaling rule is not applicable in the analog circuit domain.

Anglický abstrakt

The impact of scaling on the analog performance of CMOS circuits was studied. The solution space for analog scaling was explored between two dimensions: "a standard digital scaling" axis and an "increased bandwidth and dynamic-range" axis. Circuit simulation was applied to explore trends in noise and linearity performance under analog operating conditions at device level and for a basic circuit block. It appears that a single scaling rule is not applicable in the analog circuit domain.

BibTex


@inproceedings{BUT4940,
  author="Vladislav {Musil} and Roman {Prokop} and Petr {Hub}",
  title="Scaling in Analog Circuit Design",
  annote="The impact of scaling on the analog performance of CMOS circuits was studied. The solution space for analog scaling was explored between two dimensions: "a standard digital scaling" axis and an "increased bandwidth and dynamic-range" axis. Circuit simulation was applied to explore trends in noise and linearity performance under analog operating conditions at device level and for a basic circuit block. It appears that a single scaling rule is not applicable in the analog circuit domain.",
  address="Vysoké učení technické v Brně",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS",
  chapter="4940",
  institution="Vysoké učení technické v Brně",
  year="2002",
  month="january",
  pages="150",
  publisher="Vysoké učení technické v Brně",
  type="conference paper"
}