Detail publikace

Non-Destructive Testing for Cracks in Special Conductive Materials

Originální název

Non-Destructive Testing for Cracks in Special Conductive Materials

Anglický název

Non-Destructive Testing for Cracks in Special Conductive Materials

Jazyk

en

Originální abstrakt

In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.

Anglický abstrakt

In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.

BibTex


@article{BUT48405,
  author="Jarmila {Dědková}",
  title="Non-Destructive Testing for Cracks in Special Conductive Materials",
  annote="In this paper we propose new approaches for recovering conductivity distribution of special structures called honeycombs using electric impedance tomography (EIT). There is presented that algorithms based on stochastic methods are suitable for the detection of some cracks in the conductive honeycombs. There are compared numerical results obtained using stochastic method and using widely known deterministic methods.",
  address="Springer Berlin",
  chapter="48405",
  institution="Springer Berlin",
  journal="Studies in Computational Intelligence, Springer Berlin / Heidelberg",
  number="119",
  volume="2008",
  year="2008",
  month="july",
  pages="299--303",
  publisher="Springer Berlin",
  type="journal article - other"
}