Detail publikace

Charge carrier transport and noise of niobium capacitors

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

Originální název

Charge carrier transport and noise of niobium capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.

Klíčová slova v angličtině

Noise, niobium capacitor, spectral density

Autoři

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

Rok RIV

2002

Vydáno

20. 10. 2002

Nakladatel

Electronic Components Institute Internationale, Ltd.

Místo

SWINDON, England

Strany od

32

Strany do

36

Strany počet

5

BibTex

@inproceedings{BUT4821,
  author="Josef {Šikula} and Jan {Pavelka} and Pavel {Dobis} and Tomáš {Zedníček}",
  title="Charge carrier transport and noise of niobium capacitors",
  booktitle="Proceeding of CARTS 2002 - 16th European Passive Components Conference",
  year="2002",
  pages="5",
  publisher="Electronic Components Institute Internationale, Ltd.",
  address="SWINDON, England"
}