Detail publikace

Statistical Approach to Roughness-Induced Shielding Effects

POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

Originální název

Statistical Approach to Roughness-Induced Shielding Effects

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

A new theoretical concept is introduced to describe the roughness-induced shielding effects in metallic materials. This approach is based on the statistics of the local ratio between the characteristic microstuctural distance and the plastic zone size. A general equation involving both the crack branching and the crack closure phenomena is derived in the frame of linear elastic fracture mechanics under the assumption of remote mode I loading. It enablesthe determination of the intrinsic valuesof both the fracture toughness and the fatigue crack growth threshold. Moreover, the roughness-induced component can be separated from other closure components, such as the plasticity or oxide-induced closure. In order to estimate the total roughness-induced shileding effect only standard materials data such as the yield stress, the mean grain size, the surface roughness and the fracture mode are necessary. Examples of applications concerning static fracture and fatigue are presented for selected metallic materials.

Klíčová slova

crack branching; crack closure; roughness-induced shielding; size ratio; statistical approach

Autoři

POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

Rok RIV

2004

Vydáno

1. 3. 2004

Nakladatel

'Neuveden'

Místo

'Neuveden'

ISSN

8756-758X

Periodikum

Fatigue & Fracture of Engineering Materials & Structures

Ročník

27

Číslo

2

Stát

Spojené království Velké Británie a Severního Irska

Strany od

141

Strany do

157

Strany počet

17

BibTex

@article{BUT42400,
  author="Jaroslav {Pokluda} and Pavel {Šandera} and Jana {Horníková}",
  title="Statistical Approach to Roughness-Induced Shielding Effects",
  journal="Fatigue & Fracture of Engineering Materials & Structures",
  year="2004",
  volume="27",
  number="2",
  pages="17",
  issn="8756-758X"
}