Detail publikace

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

Originální název

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

Anglický název

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

Jazyk

en

Originální abstrakt

An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

Anglický abstrakt

An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

BibTex


@article{BUT42097,
  author="Josef {Šikula} and Vlasta {Sedláková} and Pavel {Dobis}",
  title="Noise and Non-Linearity as Reliability Indicators of Electronic Devices",
  annote="An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.",
  chapter="42097",
  number="4",
  volume="2003",
  year="2004",
  month="january",
  pages="213--221",
  type="journal article"
}