Detail publikace

Charge transport in highly efficient iridium cored electrophosphorent dendrimers

Originální název

Charge transport in highly efficient iridium cored electrophosphorent dendrimers

Anglický název

Charge transport in highly efficient iridium cored electrophosphorent dendrimers

Jazyk

en

Originální abstrakt

Electrophosphorescent dendrimers are promising materials for highly efficient light-emitting diodes. They consist of a phosphorescent core onto which dendritic groups are attached. Here, we present an investigation into the optical and electronic properties of highly efficient phosphorescent dendrimers. The effect of dendrimer structure on charge transport and optical properties is studied using temperature-dependent charge-generation-layer time-of-flight measurements and current voltage (I-V) analysis .

Anglický abstrakt

Electrophosphorescent dendrimers are promising materials for highly efficient light-emitting diodes. They consist of a phosphorescent core onto which dendritic groups are attached. Here, we present an investigation into the optical and electronic properties of highly efficient phosphorescent dendrimers. The effect of dendrimer structure on charge transport and optical properties is studied using temperature-dependent charge-generation-layer time-of-flight measurements and current voltage (I-V) analysis .

BibTex


@article{BUT41981,
  author="John {Markham} and Ian {Samuel} and Scot {Burn} and Martin {Weiter} and Hienz {Baessler}",
  title="Charge transport in highly efficient iridium cored electrophosphorent dendrimers",
  annote="Electrophosphorescent dendrimers are promising materials for highly efficient light-emitting diodes. They consist of a phosphorescent core onto which dendritic groups are attached. Here, we present an investigation into the optical and electronic properties of highly efficient phosphorescent dendrimers. The effect of dendrimer structure on charge transport and optical properties is studied using temperature-dependent charge-generation-layer time-of-flight measurements and current voltage (I-V) analysis .",
  chapter="41981",
  journal="Journal of Aplied Physics",
  number="2",
  volume="95",
  year="2004",
  month="january",
  pages="438",
  type="journal article - other"
}