Detail publikace

Parametric Reduction of Jacobian Matrix for Fault Analysis

Originální název

Parametric Reduction of Jacobian Matrix for Fault Analysis

Anglický název

Parametric Reduction of Jacobian Matrix for Fault Analysis

Jazyk

en

Originální abstrakt

The paper deals with a fast numerical method for generating the Jacobian matrix of network function for large analog linear circuits. It is based on the use of cofactor matrices. The computational cost of the Jacobian is comparable to the cost of computing a single network function on selected frequencies. In addition, the method allows performing the reduction of Jacobian matrix based on large-change sensitivities in order to decrease the computational complexity of subsequent testability analysis. An example analysis of a frequency filter is presented.

Anglický abstrakt

The paper deals with a fast numerical method for generating the Jacobian matrix of network function for large analog linear circuits. It is based on the use of cofactor matrices. The computational cost of the Jacobian is comparable to the cost of computing a single network function on selected frequencies. In addition, the method allows performing the reduction of Jacobian matrix based on large-change sensitivities in order to decrease the computational complexity of subsequent testability analysis. An example analysis of a frequency filter is presented.

BibTex


@inproceedings{BUT34795,
  author="Zdeněk {Kolka} and Zdeněk {Kincl} and Dalibor {Biolek} and Viera {Biolková}",
  title="Parametric Reduction of Jacobian Matrix for Fault Analysis",
  annote="The paper deals with a fast numerical method for generating the Jacobian matrix of network function for large analog linear circuits. It is based on the use of cofactor matrices. The computational cost of the Jacobian is comparable to the cost of computing a single network function on selected frequencies. In addition, the method allows performing the reduction of Jacobian matrix based on large-change sensitivities in order to decrease the computational complexity of subsequent testability analysis. An example analysis of a frequency filter is presented.",
  address="IEEE",
  booktitle="Proc. of the 22nd IEEE International Conference on Microelectronics (ICM 2010)",
  chapter="34795",
  doi="10.1109/ICM.2010.5696200",
  howpublished="electronic, physical medium",
  institution="IEEE",
  year="2010",
  month="december",
  pages="503--506",
  publisher="IEEE",
  type="conference paper"
}