Detail publikace

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

Originální název

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

Anglický název

The Measurement of Temperature Characteristics of Cu Bulk Resistivity

Jazyk

en

Originální abstrakt

This contribution contain a presentation of a results of the numerical modeling during design of measurement method for determine of thermal characteristic of specific resistance of Cu bulk. Combine of numerical modeling and experimental verification brings very effective procedure during suggestion and application in cryogenic region. Results of this work are used in research activities of Czech Academy of Science, ISI-Brno.

Anglický abstrakt

This contribution contain a presentation of a results of the numerical modeling during design of measurement method for determine of thermal characteristic of specific resistance of Cu bulk. Combine of numerical modeling and experimental verification brings very effective procedure during suggestion and application in cryogenic region. Results of this work are used in research activities of Czech Academy of Science, ISI-Brno.

BibTex


@inproceedings{BUT34551,
  author="Karel {Bartušek} and Pavel {Fiala} and Přemysl {Dohnal}",
  title="The Measurement of Temperature Characteristics of Cu Bulk Resistivity",
  annote="This contribution contain a presentation of a results of the numerical modeling during design of measurement method for determine of thermal characteristic of specific resistance of Cu bulk. Combine of numerical modeling and experimental verification brings very effective procedure during suggestion and application in cryogenic region. Results of this work are used in research activities of Czech Academy of Science, ISI-Brno.",
  address="The Electromagnetic academy",
  booktitle="Progress in Electromagnetics Research Symposium (PIERS 2008)",
  chapter="34551",
  howpublished="electronic, physical medium",
  institution="The Electromagnetic academy",
  journal="Progress In Electromagnetics",
  number="2",
  year="2008",
  month="july",
  pages="764--768",
  publisher="The Electromagnetic academy",
  type="conference paper"
}