Detail publikace

Noise Spectroscopy in Micro-Wave Material Structure Examination

Originální název

Noise Spectroscopy in Micro-Wave Material Structure Examination

Anglický název

Noise Spectroscopy in Micro-Wave Material Structure Examination

Jazyk

en

Originální abstrakt

The article describes the basic study of broadband noise signal application in the investigation of materials. The aim is find a metrology method utilizable for the research on metamaterials in the frequency range of about 100 MHz to 10 GHz. The instrumental equipment and other requirements are presented. This research report provides an overview of the current potentialities in the described field and summarizes the aspects necessary for noise spectroscopy.

Anglický abstrakt

The article describes the basic study of broadband noise signal application in the investigation of materials. The aim is find a metrology method utilizable for the research on metamaterials in the frequency range of about 100 MHz to 10 GHz. The instrumental equipment and other requirements are presented. This research report provides an overview of the current potentialities in the described field and summarizes the aspects necessary for noise spectroscopy.

BibTex


@inproceedings{BUT32714,
  author="Radek {Kubásek} and Petr {Drexler} and Pavel {Fiala} and Karel {Bartušek}",
  title="Noise Spectroscopy in Micro-Wave Material Structure Examination",
  annote="The article describes the basic study of broadband noise signal application in the investigation of materials. The aim is find a metrology method utilizable for the research on metamaterials in the frequency range of about 100 MHz to 10 GHz. The instrumental equipment and other requirements are presented. This research report provides an overview of the current potentialities in the described field and summarizes the aspects necessary for noise spectroscopy.",
  address="PIERS",
  booktitle="Progress In Electromagnetics",
  chapter="32714",
  edition="1",
  howpublished="electronic, physical medium",
  institution="PIERS",
  journal="Progress In Electromagnetics",
  number="7",
  year="2009",
  month="august",
  pages="1--4",
  publisher="PIERS",
  type="conference paper"
}