Detail publikace

Low Frequency Noise Measuring in Semiconductor Devices

ANDREEV, A. ZAJAČEK, J. GRMELA, L. HOLCMAN, V.

Originální název

Low Frequency Noise Measuring in Semiconductor Devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

Klíčová slova

Low frequency noise, polovodic

Autoři

ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.

Rok RIV

2007

Vydáno

12. 8. 2007

Nakladatel

Dr. Laszlo Lehoczky

Místo

Miskolc, Hungary

ISBN

978-963-661-783-7

Kniha

6th International Conference of PhD Students

Edice

Dr. Laszlo Lehoczky

Číslo edice

1

Strany od

179

Strany do

184

Strany počet

6

BibTex

@inproceedings{BUT28507,
  author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}",
  title="Low Frequency Noise Measuring in Semiconductor Devices",
  booktitle="6th International Conference of PhD Students",
  year="2007",
  series="Dr. Laszlo Lehoczky",
  number="1",
  pages="179--184",
  publisher="Dr. Laszlo Lehoczky",
  address="Miskolc, Hungary",
  isbn="978-963-661-783-7"
}