Detail publikace

Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method

STRNADEL, J.

Originální název

Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

In the paper, multilevel extension of previously published register-transfer level testability analysis method is presented. It is illustrated how libraries and net-lists of multilevel designs can be described in special language developed for the purpose, how the method can be linked up to commercial electronic design automation tools and how information offered by the method can be utilized for guidance during testability enhancement of digital designs.

Klíčová slova

digital, circuit, design, testability, multilevel, enhancement, guidance

Autoři

STRNADEL, J.

Rok RIV

2008

Vydáno

2. 6. 2008

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-3717-3

Kniha

Proceedings of Electronic Devices and Systems IMAPS CS International Conference

Strany od

367

Strany do

372

Strany počet

6

URL

https://www.fit.vut.cz/research/publication/8631/

BibTex

@inproceedings{BUT27713,
  author="Josef {Strnadel}",
  title="Testability Enhancement of Multilevel Designs Guided by Testability Analysis Method",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference",
  year="2008",
  pages="367--372",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3717-3",
  url="https://www.fit.vut.cz/research/publication/8631/"
}