Detail publikace

Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.

Neděla V., Linhart H., Autrata R.

Originální název

Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The detection of pure secondary electrons (SE) with energy lower than 50eV, typically 5eV, by suppressing the backscattered electrons (BSE) minimizes the influence of material information in recorded picture and enables the study of topographical structure of the specimen with high resolution.

Klíčová slova

SE,BSE,detection system

Autoři

Neděla V., Linhart H., Autrata R.

Rok RIV

2006

Vydáno

1. 1. 2006

Místo

Sapporo

Strany od

982

Strany do

983

Strany počet

2

BibTex

@inproceedings{BUT24787,
  author="Vilém {Neděla} and Jan {Linhart}",
  title="Detection of the True Secondary Electrons with a Newly Designed Ionization Detector for ESEM.",
  booktitle="16th International Microscopy Congress",
  year="2006",
  pages="2",
  address="Sapporo"
}