Detail publikace

Scintillation SE Detector for Variable Pressure Microscopes

J. Jirák, J. Linhart and V. Neděla

Originální název

Scintillation SE Detector for Variable Pressure Microscopes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with secondary electrons detection in the ESEM via the entirely new type of scintillation detector. It is shown a way of using scitillation detector in the condition of elevated pressure conditions.

Klíčová slova

secondary electron, environmental scanning electron microscopy, scintillation detector

Autoři

J. Jirák, J. Linhart and V. Neděla

Rok RIV

2006

Vydáno

22. 5. 2006

Nakladatel

Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society

Místo

Brno

ISBN

80-239-6285-X

Kniha

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Strany od

37

Strany do

38

Strany počet

2

BibTex

@inproceedings{BUT24371,
  author="Josef {Jirák} and Jan {Linhart} and Vilém {Neděla}",
  title="Scintillation SE Detector for Variable Pressure Microscopes",
  booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
  year="2006",
  volume="10",
  pages="2",
  publisher="Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society",
  address="Brno",
  isbn="80-239-6285-X"
}