Detail publikace

Quartz crystal microbalance in electrochemic devices

Originální název

Quartz crystal microbalance in electrochemic devices

Anglický název

Quartz crystal microbalance in electrochemic devices

Jazyk

en

Originální abstrakt

The mass of thin layer can be observed by QCM method, it is based on changes of rezonant frekvency of quartz crystal oscillator. We started with a crystal calibration for define senzitivity factor Cf of the crystal.

Anglický abstrakt

The mass of thin layer can be observed by QCM method, it is based on changes of rezonant frekvency of quartz crystal oscillator. We started with a crystal calibration for define senzitivity factor Cf of the crystal.

BibTex


@inproceedings{BUT24268,
  author="Petr {Špičák} and Vít {Svoboda} and Marie {Sedlaříková} and Jiří {Vondrák} and Jiří {Kazelle}",
  title="Quartz crystal microbalance in electrochemic devices",
  annote="The mass of thin layer can be observed by QCM method, it is based on changes of rezonant frekvency of quartz crystal oscillator. We started with a crystal calibration for define senzitivity factor Cf of the crystal.",
  booktitle="VII. Pracovní setkání fyzikálních chemiků a elektrochemiků",
  chapter="24268",
  year="2007",
  month="january",
  pages="119",
  type="conference paper"
}