Detail publikace

Influence of higher noise level of measured voltages on error of signal reconstruction

DĚDKOVÁ, J. BACHOREC, T. STEINBAUER, M. REZ, J.

Originální název

Influence of higher noise level of measured voltages on error of signal reconstruction

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with the reconstruction of conductivity images on the basis of experimental data. The questions of the data verification and also the verification of new numeric models are discussed here in detail. Based on the obtained experience, the preconditions of the successful reconstruction are defined here.

Klíčová slova

electrical impedance tomography, finite element method, forward solution, noise level

Autoři

DĚDKOVÁ, J.; BACHOREC, T.; STEINBAUER, M.; REZ, J.

Rok RIV

2007

Vydáno

23. 5. 2007

Nakladatel

Wydrukowano w Zakladzie Graficznym Politechniki Slaskiej w Gliwicach

ISBN

978-83-85940-29-6

Kniha

IC - SPETO 2007

Strany od

197

Strany do

198

Strany počet

2

BibTex

@inproceedings{BUT23698,
  author="Jarmila {Dědková} and Tibor {Bachorec} and Miloslav {Steinbauer} and Jiří {Rez}",
  title="Influence of higher noise level of measured voltages on error of signal reconstruction",
  booktitle="IC - SPETO 2007",
  year="2007",
  pages="197--198",
  publisher="Wydrukowano w Zakladzie Graficznym Politechniki Slaskiej w Gliwicach",
  isbn="978-83-85940-29-6"
}