Detail publikace

Modeling of a Rotational Spectrometer by Ray Tracing Methods

Originální název

Modeling of a Rotational Spectrometer by Ray Tracing Methods

Anglický název

Modeling of a Rotational Spectrometer by Ray Tracing Methods

Jazyk

en

Originální abstrakt

In this paper the ray tracing method is developed and used for the modeling of a rotational spectrometer. Since the electrical size of the spectrometer is several thousands times longer compared to the wavelength, the presented approach is much suitable for the analysis of such huge devices than the classical numerical exact methods such as the fast integral methods

Anglický abstrakt

In this paper the ray tracing method is developed and used for the modeling of a rotational spectrometer. Since the electrical size of the spectrometer is several thousands times longer compared to the wavelength, the presented approach is much suitable for the analysis of such huge devices than the classical numerical exact methods such as the fast integral methods

Dokumenty

BibTex


@inproceedings{BUT23559,
  author="Jaroslav {Láčík} and Zbyněk {Lukeš} and Zbyněk {Raida}",
  title="Modeling of a Rotational Spectrometer by Ray Tracing Methods",
  annote="In this paper the ray tracing method is developed and used for the modeling of a rotational spectrometer. Since the electrical size of the spectrometer is several thousands times longer compared to the wavelength, the presented approach is much suitable for the analysis of such huge devices than the classical numerical exact methods such as the fast integral methods",
  address="POLITECNICO DI TORINO",
  booktitle="Proceeding of ICEAA `07",
  chapter="23559",
  institution="POLITECNICO DI TORINO",
  year="2007",
  month="september",
  pages="1--3",
  publisher="POLITECNICO DI TORINO",
  type="conference paper"
}