Detail publikace

Electromagnetism and Thermodynamics in LV Circuit Breakers

Originální název

Electromagnetism and Thermodynamics in LV Circuit Breakers

Anglický název

Electromagnetism and Thermodynamics in LV Circuit Breakers

Jazyk

en

Originální abstrakt

This paper deals with influence of electromagnetic field and thermodynamics in various periods of extinguishing process in low voltage circuit breakers. The individual influences are analysed with the help of combination of numerical and experimental methods. The numerical simulation was performed for thermodynamic analysis in module FLOTRAN of ANSYS program and for electromagnetic analysis in ANSYS program. Experiments were performed at our department on laboratory short-circuit test bench. High-speed camera was used for arc behavior diagnostics.

Anglický abstrakt

This paper deals with influence of electromagnetic field and thermodynamics in various periods of extinguishing process in low voltage circuit breakers. The individual influences are analysed with the help of combination of numerical and experimental methods. The numerical simulation was performed for thermodynamic analysis in module FLOTRAN of ANSYS program and for electromagnetic analysis in ANSYS program. Experiments were performed at our department on laboratory short-circuit test bench. High-speed camera was used for arc behavior diagnostics.

BibTex


@inproceedings{BUT23557,
  author="Jiří {Valenta} and Zdeněk {Vávra} and Jaromír {Vaněk}",
  title="Electromagnetism and Thermodynamics in LV Circuit Breakers",
  annote="This paper deals with influence of electromagnetic field and thermodynamics in various periods of extinguishing process in low voltage circuit breakers. The individual influences are analysed with the help of combination of numerical and experimental methods. The numerical simulation was performed for thermodynamic analysis in module FLOTRAN of ANSYS program and for electromagnetic analysis in ANSYS program. Experiments were performed at our department on laboratory short-circuit test bench. High-speed camera was used for arc behavior diagnostics.",
  address="ÚVEE FEKT VUT",
  booktitle="Proceedings of the XVIIth Symposium on Physics of Switching Arc Volume I: Contributed Papers",
  chapter="23557",
  institution="ÚVEE FEKT VUT",
  year="2007",
  month="september",
  pages="221--224",
  publisher="ÚVEE FEKT VUT",
  type="conference paper"
}