Detail publikace

Testing of solar cells using fast transients.

J.Boušek

Originální název

Testing of solar cells using fast transients.

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. The measurement and evaluation procedure is very simple and no expensive devices are needed, but there are two problems which must be always considered. Firstly the recombination time depends on the actual concentration of minority carriers and also trapping effects can superimpose to the minority carriers concentration decay. Other problem is influence of cell junction parameters, especially the depletion layer capacitance, which masks the recombination phenomena. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

Klíčová slova

solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance

Autoři

J.Boušek

Rok RIV

2005

Vydáno

14. 9. 2005

Nakladatel

Nakl. Novotný

Místo

Brno

ISBN

80-214-2990-9

Kniha

Electronic Devices and Systems 2005. Proceedings

Strany od

194

Strany do

199

Strany počet

6

BibTex

@inproceedings{BUT20895,
  author="Jaroslav {Boušek}",
  title="Testing of solar cells using fast transients.",
  booktitle="Electronic Devices and Systems 2005. Proceedings",
  year="2005",
  pages="6",
  publisher="Nakl. Novotný",
  address="Brno",
  isbn="80-214-2990-9"
}