Detail publikace

Finite element model of noise in piezoceramic sensor

Originální název

Finite element model of noise in piezoceramic sensor

Anglický název

Finite element model of noise in piezoceramic sensor

Jazyk

en

Originální abstrakt

The high sensitivity with wide bandwidth is required for sensor applications in non-destructive testing (NDT). The sensitivity of piezoceramic sensors demands to minimize their noise especially thermal noise, polarisation noise and 1/f noise, which are the main sources of voltage or current fluctuation in this kind of sensors. For simplicity, only the piezoceramic part of sensor was under study. We investigated samples with the same geometry and material. The theoretical and numerical results are compared with experimental results, which were measured on our noise measurement set-up.

Anglický abstrakt

The high sensitivity with wide bandwidth is required for sensor applications in non-destructive testing (NDT). The sensitivity of piezoceramic sensors demands to minimize their noise especially thermal noise, polarisation noise and 1/f noise, which are the main sources of voltage or current fluctuation in this kind of sensors. For simplicity, only the piezoceramic part of sensor was under study. We investigated samples with the same geometry and material. The theoretical and numerical results are compared with experimental results, which were measured on our noise measurement set-up.

BibTex


@inproceedings{BUT19062,
  author="Petr {Sedlák} and Jiří {Majzner} and Josef {Šikula} and Vlasta {Sedláková}",
  title="Finite element model of noise in piezoceramic sensor",
  annote="The high sensitivity with wide bandwidth is required for sensor applications in non-destructive testing (NDT). The sensitivity of piezoceramic sensors demands to minimize their noise especially thermal noise, polarisation noise and 1/f noise, which are the main sources of voltage or current fluctuation in this kind of sensors. For simplicity, only the piezoceramic part of sensor was under study. We investigated samples with the same geometry and material. The theoretical and numerical results are compared with experimental results, which were measured on our noise measurement set-up.",
  address="MIDEM",
  booktitle="Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition",
  chapter="19062",
  institution="MIDEM",
  year="2006",
  month="may",
  pages="325",
  publisher="MIDEM",
  type="conference paper"
}