Detail publikace

Raman spectroscopy to monitor the effects of temperature regime and medium composition on microorganism growth

SAMEK, O. NĚMCOVÁ, A. MÁROVÁ, I.

Originální název

Raman spectroscopy to monitor the effects of temperature regime and medium composition on microorganism growth

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A biomass of yeast strains has been studied using Raman spectroscopy due to their potential applications in the field of biofuel generation, food industry and biotechnological applications. In order to utilize biomass for efficient industrial/biotechnological production, the optimal cultivation parameters have to be determined which in turn lead to high production of desired substances such as oil, carotenoids, and pigments in the selected cell line of yeast. Therefore, we focused on different cultivation conditions (the effects of temperature regime and medium composition) and their influence on microorganisms growth and metabolic changes.

Klíčová slova

Raman spectroscopy; palm oil; yeast; pulcherrimin

Autoři

SAMEK, O.; NĚMCOVÁ, A.; MÁROVÁ, I.

Vydáno

5. 9. 2016

Nakladatel

SPIE-INT SOC OPTICAL ENGINEERING

Místo

BELLINGHAM

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

1

Číslo

1

Stát

Spojené státy americké

Strany od

1

Strany do

4

Strany počet

4

URL

http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=7&SID=C4Ei1hn24F5jaj4dWSW&page=1&doc=24

BibTex

@inproceedings{BUT170296,
  author="Ota {Samek} and Andrea {Němcová} and Ivana {Márová}",
  title="Raman spectroscopy to monitor the effects of temperature regime and medium composition on microorganism growth",
  booktitle="Book Series: ‏ Proceedings of SPIE   Volume: ‏ 10142",
  year="2016",
  series="1",
  journal="Proceedings of SPIE",
  volume="1",
  number="1",
  pages="1--4",
  publisher="SPIE-INT SOC OPTICAL ENGINEERING",
  address="BELLINGHAM",
  doi="10.1117/12.2263378",
  issn="0277-786X",
  url="http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=7&SID=C4Ei1hn24F5jaj4dWSW&page=1&doc=24"
}