Detail publikace

Design, Verification, Test and In-Field Implications of Approximate Computing Systems

BOSIO, A. DI CARLO, S. GIRARD, P. SANCHEZ, E. SAVINO, A. SEKANINA, L. TRAIOLA, M. VAŠÍČEK, Z. VIRAZEL, A.

Originální název

Design, Verification, Test and In-Field Implications of Approximate Computing Systems

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Today, the concept of approximation in computing is becoming more and more a "hot topic" to investigate how computing systems can be more energy efficient, faster, and less complex. Intuitively, instead of performing exact computations and, consequently, requiring a high amount of resources, Approximate Computing aims at selectively relaxing the specifications, trading accuracy off for efficiency. While Approximate Computing gives several promises when looking at systems' performance, energy efficiency and complexity, it poses significant challenges regarding the design, the verification, the test and the in-field reliability of Approximate Computing systems. This tutorial paper covers these aspects leveraging the experience of the authors in the field to present state-of-the-art solutions to apply during the different development phases of an Approximate Computing system.

Klíčová slova

approximate computing, circuit, design, test

Autoři

BOSIO, A.; DI CARLO, S.; GIRARD, P.; SANCHEZ, E.; SAVINO, A.; SEKANINA, L.; TRAIOLA, M.; VAŠÍČEK, Z.; VIRAZEL, A.

Vydáno

6. 7. 2020

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Los Alamitos

ISBN

978-1-7281-4312-5

Kniha

25th IEEE European Test Symposium

Strany od

1

Strany do

10

Strany počet

10

URL

https://ieeexplore.ieee.org/document/9131557

BibTex

@inproceedings{BUT168125,
  author="BOSIO, A. and DI CARLO, S. and GIRARD, P. and SANCHEZ, E. and SAVINO, A. and SEKANINA, L. and TRAIOLA, M. and VAŠÍČEK, Z. and VIRAZEL, A.",
  title="Design, Verification, Test and In-Field Implications of Approximate Computing Systems",
  booktitle="25th IEEE European Test Symposium",
  year="2020",
  pages="1--10",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Los Alamitos",
  doi="10.1109/ETS48528.2020.9131557",
  isbn="978-1-7281-4312-5",
  url="https://ieeexplore.ieee.org/document/9131557"
}