Detail publikace

Wide-Cone Angle Phase-Contrast X-Ray Computed Tomography of Synthetic Polymer Materials

KALASOVÁ, D. BŘÍNEK, A. ŠLOUF, M. DUŠKOVÁ - SMRČKOVÁ, M. ZIKMUND, T. PATÁKOVÁ, Z. KAISER, J.

Originální název

Wide-Cone Angle Phase-Contrast X-Ray Computed Tomography of Synthetic Polymer Materials

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

X-ray phase-contrast imaging (PCI) is sensitive to the phase shift of X-rays induced by the sample. This is advantageous for low X-ray absorption samples, such as polymers, biomaterials, tissues, and scaffolds. We show propagation-based phase-contrast X-ray computed tomography (CT) imaging [propagation-based imaging (PBI)] in a specific configuration with the wide-cone angle (>50 degrees), polychromatic X-ray source, and a flat-panel detector. We demonstrate PBI on measurements with a polymer composite. The experiments show a tradeoff between high signal-to-noise ratio (SNR) acquisition at very large cone angles and low-SNR acquisition at large propagation distances. The degree of data quality improvement by phase retrieval increases for high propagation distances. We show the application of PBI on macroporous synthetic hydrogels, which represents an important type of material with a complex 3-D morphology in the field of polymer science. With the use of the above-described experimental configuration, it is possible to visualize the hydrogels and segment the structure of the sample in tomographic data. The segmented sample can be used for morphology characterization, such as the description of internal space or determination of specific surface area (SSA).

Klíčová slova

X-ray imaging; Polymers; Computed tomography; Scanning electron microscopy; Detectors; Phase-contrast imaging (PCI); propagation based imaging (PBI); synthetic polymer materials; wide-cone angle X-ray computed tomography (CT); X-ray CT

Autoři

KALASOVÁ, D.; BŘÍNEK, A.; ŠLOUF, M.; DUŠKOVÁ - SMRČKOVÁ, M.; ZIKMUND, T.; PATÁKOVÁ, Z.; KAISER, J.

Vydáno

1. 11. 2020

Nakladatel

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Místo

PISCATAWAY

ISSN

0018-9456

Periodikum

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

Ročník

69

Číslo

11

Stát

Spojené státy americké

Strany od

8910

Strany do

8918

Strany počet

9

URL

https://ieeexplore.ieee.org/document/9094587

BibTex

@article{BUT165958,
  author="Dominika {Kalasová} and Adam {Břínek} and Miroslav {Šlouf} and Miroslava {Dušková - Smrčková} and Tomáš {Zikmund} and Zuzana {Patáková} and Jozef {Kaiser}",
  title="Wide-Cone Angle Phase-Contrast X-Ray Computed Tomography of Synthetic Polymer Materials",
  journal="IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT",
  year="2020",
  volume="69",
  number="11",
  pages="8910--8918",
  doi="10.1109/TIM.2020.2995232",
  issn="0018-9456",
  url="https://ieeexplore.ieee.org/document/9094587"
}