Detail publikace

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

FIALA, P. BARTUŠEK, K. DĚDKOVÁ, J. KADLEC, R. DOHNAL, P.

Originální název

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Klíčová slova

Nanomaterials; multilayered material; resonance; periodic system; electromagnetic wave; X-ray; gamma-ray; antireflection; shielding

Autoři

FIALA, P.; BARTUŠEK, K.; DĚDKOVÁ, J.; KADLEC, R.; DOHNAL, P.

Vydáno

30. 7. 2019

Nakladatel

https://content.sciendo.com/configurable/contentpage/journals$002fmsr$002f19$002f4$002farticle-p144.xml

Místo

WARSAW, POLAND

ISSN

1335-8871

Periodikum

Measurement Science Review

Ročník

19

Číslo

4

Stát

Slovenská republika

Strany od

144

Strany do

152

Strany počet

9

URL

Plný text v Digitální knihovně

BibTex

@article{BUT161036,
  author="Pavel {Fiala} and Karel {Bartušek} and Jarmila {Dědková} and Radim {Kadlec} and Přemysl {Dohnal}",
  title="Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation",
  journal="Measurement Science Review",
  year="2019",
  volume="19",
  number="4",
  pages="144--152",
  doi="10.2478/msr-2019-0020",
  issn="1335-8871",
  url="http://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INT"
}