Detail publikace

Experimental X- and Gamma Ray Measurement of Nanoparticles and Nanolayers

FIALA, P. LONDÁK, P. BARTUŠEK, K.

Originální název

Experimental X- and Gamma Ray Measurement of Nanoparticles and Nanolayers

Anglický název

Experimental X- and Gamma Ray Measurement of Nanoparticles and Nanolayers

Jazyk

en

Originální abstrakt

The paper presents models and experimental measurements applicable within simulation of tuned multilayered periodic structures, especially in the gamma region of the electromagnetic spectrum. Using a sample bilayer of inorganic materials designed as a resonant structure, the authors demonstrate the ability of such structures to absorb or let through an electromagnetic wave having a specific wavelength.

Anglický abstrakt

The paper presents models and experimental measurements applicable within simulation of tuned multilayered periodic structures, especially in the gamma region of the electromagnetic spectrum. Using a sample bilayer of inorganic materials designed as a resonant structure, the authors demonstrate the ability of such structures to absorb or let through an electromagnetic wave having a specific wavelength.

Dokumenty

BibTex


@inproceedings{BUT160889,
  author="Pavel {Fiala} and Pavel {Londák} and Karel {Bartušek}",
  title="Experimental X- and Gamma Ray Measurement of Nanoparticles and Nanolayers",
  annote="The paper presents models and experimental measurements applicable within simulation of tuned multilayered periodic structures, especially in the gamma region of the electromagnetic spectrum. Using a sample bilayer of inorganic materials designed as a resonant structure, the authors demonstrate the ability of such structures to absorb or let through an electromagnetic wave having a specific wavelength.",
  address="IEEE",
  booktitle="2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)",
  chapter="160889",
  doi="10.1109/PIERS-Spring46901.2019.9017311",
  howpublished="online",
  institution="IEEE",
  year="2019",
  month="june",
  pages="1979--1983",
  publisher="IEEE",
  type="conference paper"
}