Detail publikace

Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions

Originální název

Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions

Anglický název

Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions

Jazyk

en

Originální abstrakt

The article deals with issues to be tackled when performing experiments with low voltage devices under real switching conditions and subsequently discusses various phenomena in an experimental device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic methods. The second part describes some phenomena encountered during switching process under real switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only important for experimental study itself but also form necessary input data for numerical models and their validation.

Anglický abstrakt

The article deals with issues to be tackled when performing experiments with low voltage devices under real switching conditions and subsequently discusses various phenomena in an experimental device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic methods. The second part describes some phenomena encountered during switching process under real switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only important for experimental study itself but also form necessary input data for numerical models and their validation.

BibTex


@article{BUT141216,
  author="Jiří {Valenta} and Matěj {Samohejl} and Martin {Fendrych} and Petr {Kloc} and Lukáš {Dostál}",
  title="Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions",
  annote="The article deals with issues to be tackled when performing experiments with low voltage
devices under real switching conditions and subsequently discusses various phenomena in an experimental
device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic
methods. The second part describes some phenomena encountered during switching process under real
switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only
important for experimental study itself but also form necessary input data for numerical models and
their validation.",
  address="Department of Physics, FEE CTU in Prague",
  chapter="141216",
  doi="10.14311/ppt.2017.3.257",
  howpublished="online",
  institution="Department of Physics, FEE CTU in Prague",
  number="3",
  volume="4",
  year="2017",
  month="september",
  pages="257--260",
  publisher="Department of Physics, FEE CTU in Prague",
  type="journal article in Scopus"
}