Detail publikace

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

STRNADEL, J.

Originální název

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

Anglický název

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

Jazyk

en

Originální abstrakt

The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.

Anglický abstrakt

The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.

Dokumenty

BibTex


@inproceedings{BUT13959,
  author="Josef {Strnadel}",
  title="Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability",
  annote="The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.",
  address="Publishing House of Poznan University of Technology",
  booktitle="Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  chapter="13959",
  institution="Publishing House of Poznan University of Technology",
  year="2003",
  month="april",
  pages="303--304",
  publisher="Publishing House of Poznan University of Technology",
  type="conference paper"
}