Detail publikace

Numerical Simulation of the Nail Test

VYROUBAL, P. KAZDA, T. BAYER, R.

Originální název

Numerical Simulation of the Nail Test

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Internal short-circuit is the most dangerous abusive condition for Li-ion batteries and has been the root cause for several catastrophic accidents involving Li-ion batteries in recent years. Large-format Li-ion batteries are particularly vulnerable to internal short-circuits because of high energy content. Nail penetration test is commonly used to study the internal shortcircuits, but the test results usually have poor reproducibility and offer limited insight. This paper deals with a possibility of numerical simulation of internal short circuit test using FEM.

Klíčová slova

Lithium Ion Battery, FEM, nail test, short circuit

Autoři

VYROUBAL, P.; KAZDA, T.; BAYER, R.

Vydáno

29. 8. 2016

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-5384-5

Kniha

Advanced Batteries Accumulators and Fuel Cells – 17th ABAF

Strany od

169

Strany do

170

Strany počet

2

BibTex

@inproceedings{BUT128352,
  author="Petr {Vyroubal} and Tomáš {Kazda} and Robert {Bayer}",
  title="Numerical Simulation of the Nail Test",
  booktitle="Advanced Batteries Accumulators and Fuel Cells – 17th ABAF",
  year="2016",
  pages="169--170",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-5384-5"
}