Detail publikace

Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM

Veronika Novotná, Vladislav Krzyžánek, Kamila Dobranská, Jana Nebesářová

Originální název

Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM

Typ

abstrakt

Jazyk

angličtina

Originální abstrakt

This abstract for Microscopy and Microanalysis 2014 conference in Hartford,USA speaks about influence of the primary electron beam to the sensitive samples in the low voltage STEM.

Klíčová slova

STEM, Embedding media, Epon, Spurr, LR White, Mass loss

Autoři

Veronika Novotná, Vladislav Krzyžánek, Kamila Dobranská, Jana Nebesářová

Vydáno

4. 8. 2014

Místo

Hartford, USA

Strany počet

2

BibTex

@misc{BUT121044,
  author="Veronika {Novotná}",
  title="Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM",
  year="2014",
  pages="2",
  address="Hartford, USA",
  note="abstract"
}