Detail publikace

Reliable Modeling of Ideal Generic Memristors via State-Space Transformation

Originální název

Reliable Modeling of Ideal Generic Memristors via State-Space Transformation

Anglický název

Reliable Modeling of Ideal Generic Memristors via State-Space Transformation

Jazyk

en

Originální abstrakt

The paper refers to problems of modeling and computer simulation of generic memristors caused by the so-called window functions, namely the stick effect, nonconvergence, and finding fundamentally incorrect solutions. A profoundly different modeling approach is proposed, which is mathematically equivalent to window-based modeling. However, due to its numerical stability, it definitely smoothes the above problems away.

Anglický abstrakt

The paper refers to problems of modeling and computer simulation of generic memristors caused by the so-called window functions, namely the stick effect, nonconvergence, and finding fundamentally incorrect solutions. A profoundly different modeling approach is proposed, which is mathematically equivalent to window-based modeling. However, due to its numerical stability, it definitely smoothes the above problems away.

BibTex


@article{BUT114989,
  author="Dalibor {Biolek} and Zdeněk {Biolek} and Viera {Biolková} and Zdeněk {Kolka}",
  title="Reliable Modeling of Ideal Generic Memristors via State-Space Transformation",
  annote="The paper refers to problems of modeling and computer simulation of generic memristors caused by the so-called window functions, namely the stick effect, nonconvergence, and finding fundamentally incorrect solutions. A profoundly different modeling approach is proposed, which is mathematically equivalent to window-based modeling. However, due to its numerical stability, it definitely smoothes the above problems away.",
  address="Společnost pro radiotechnické inženýrství",
  chapter="114989",
  doi="10.13164/re.2015.0393",
  institution="Společnost pro radiotechnické inženýrství",
  number="2",
  volume="24",
  year="2015",
  month="june",
  pages="393--407",
  publisher="Společnost pro radiotechnické inženýrství",
  type="journal article in Web of Science"
}