Detail publikace

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

Originální název

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

Anglický název

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

Jazyk

en

Originální abstrakt

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.

Anglický abstrakt

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.

BibTex


@article{BUT114511,
  author="Veronika {Schmiedová} and Patricie {Heinrichová} and Oldřich {Zmeškal} and Martin {Weiter}",
  title="Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry",
  annote="This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.",
  address="Applied surface science",
  chapter="114511",
  doi="10.1016/j.apsusc.2015.05.027",
  howpublished="online",
  institution="Applied surface science",
  number="10",
  volume="349",
  year="2015",
  month="september",
  pages="582--588",
  publisher="Applied surface science",
  type="journal article in Web of Science"
}