Detail publikace

Local characterization of optical waveguide structure using Scanning near-field optical microscopy

OTEVŘELOVÁ, D. TOMÁNEK, P. GRMELA, L.

Originální název

Local characterization of optical waveguide structure using Scanning near-field optical microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of perturbation of the SNOM probe on the measurement of the local field shows a weak but measurable perturbation, and the dependence on aperture and material parameters will be discussed.

Klíčová slova

waveguide, optical properties, local probe measurement

Autoři

OTEVŘELOVÁ, D.; TOMÁNEK, P.; GRMELA, L.

Rok RIV

2004

Vydáno

16. 6. 2004

Nakladatel

Slovak Technical University in Bratislava

Místo

Bratislava

ISBN

80-227-2073-9

Kniha

Applied physics on condensed matter APCOM – 2004

Strany od

183

Strany do

186

Strany počet

4

BibTex

@inproceedings{BUT10972,
  author="Dana {Otevřelová} and Pavel {Tománek} and Lubomír {Grmela}",
  title="Local characterization of optical waveguide structure using Scanning near-field optical microscopy",
  booktitle="Applied physics on condensed matter APCOM – 2004",
  year="2004",
  pages="183--186",
  publisher="Slovak Technical University in Bratislava",
  address="Bratislava",
  isbn="80-227-2073-9"
}