Detail publikace

Characterization of the cover Voltage Transformers (VT)

WASSERBAUER, J. OPRAVIL, T. ZMRZLÝ, M. KOUBA, J.

Originální název

Characterization of the cover Voltage Transformers (VT)

Anglický název

Characterization of the cover Voltage Transformers (VT)

Jazyk

en

Originální abstrakt

The research report has 29 pages. It was prepared for the company ABB s.r.o.. Preparation and measurement of delivered samples is described. The structure of the cover Voltage Transformers (VT) was observed by the stereomicroscope ZEISS STEMI-2000 and the inverted light microscope ZEISS AXIO OBSERVER Z1m. The structure analysis of surface and element analysis was performed on a scanning electron microscope ZEISS EVO LS10 with an energy dispersive analyzer OXFORD X-Max 80 mm2. For the crystalline phase identification was performed a X-Ray Diffractometer EMPYREAN. The microhardness was measured using a LECO microhardness tester AMH43.

Anglický abstrakt

The research report has 29 pages. It was prepared for the company ABB s.r.o.. Preparation and measurement of delivered samples is described. The structure of the cover Voltage Transformers (VT) was observed by the stereomicroscope ZEISS STEMI-2000 and the inverted light microscope ZEISS AXIO OBSERVER Z1m. The structure analysis of surface and element analysis was performed on a scanning electron microscope ZEISS EVO LS10 with an energy dispersive analyzer OXFORD X-Max 80 mm2. For the crystalline phase identification was performed a X-Ray Diffractometer EMPYREAN. The microhardness was measured using a LECO microhardness tester AMH43.

Dokumenty

BibTex 


@misc{BUT106316,
  author="Jaromír {Wasserbauer} and Tomáš {Opravil} and Martin {Zmrzlý} and Jan {Kouba}",
  title="Characterization of the cover Voltage Transformers (VT)",
  annote="The research report has 29 pages. It was prepared for the company ABB s.r.o.. Preparation and measurement of delivered samples is described. The structure of the cover Voltage Transformers (VT) was observed by the stereomicroscope ZEISS STEMI-2000 and the inverted light microscope ZEISS AXIO OBSERVER Z1m. The structure analysis of surface and element analysis was performed on a scanning electron microscope ZEISS EVO LS10 with an energy dispersive analyzer OXFORD X-Max 80 mm2. For the crystalline phase identification was performed a X-Ray Diffractometer EMPYREAN. The microhardness was measured using a LECO microhardness tester AMH43.",
  chapter="106316",
  year="2013",
  month="september",
  pages="1--29"
}