Detail publikace

Non-Stationary Statistical Simulation of Blind-Oversampling CDR Circuits

Originální název

Non-Stationary Statistical Simulation of Blind-Oversampling CDR Circuits

Anglický název

Non-Stationary Statistical Simulation of Blind-Oversampling CDR Circuits

Jazyk

en

Originální abstrakt

Statistical approach is the only practical set of methods for reliable simulation of Clock and Data Recovery circuits which operate at low bit-error rates. The paper deals with a statistical simulation model for blind-oversampling CDR circuits, which estimate the center of the data eye by counting the edges in several subintervals that divide the signal period. In the steady-state, the process is described by the multinomial distribution. The developed model simulates the estimation process in the non-stationary case, which allows including sinusoidal jitter, and frequency offset. Some simulation results are presented.

Anglický abstrakt

Statistical approach is the only practical set of methods for reliable simulation of Clock and Data Recovery circuits which operate at low bit-error rates. The paper deals with a statistical simulation model for blind-oversampling CDR circuits, which estimate the center of the data eye by counting the edges in several subintervals that divide the signal period. In the steady-state, the process is described by the multinomial distribution. The developed model simulates the estimation process in the non-stationary case, which allows including sinusoidal jitter, and frequency offset. Some simulation results are presented.

BibTex


@inproceedings{BUT102778,
  author="Zdeněk {Kolka} and Michal {Kubíček} and Viera {Biolková} and Dalibor {Biolek}",
  title="Non-Stationary Statistical Simulation of Blind-Oversampling CDR Circuits",
  annote="Statistical approach is the only practical set of methods for reliable simulation of Clock and Data Recovery circuits which operate at low bit-error rates. The paper deals with a statistical simulation model for blind-oversampling CDR circuits, which estimate the center of the data eye by counting the edges in several subintervals that divide the signal period. In the steady-state, the process is described by the multinomial distribution. The developed model simulates the estimation process in the non-stationary case, which allows including sinusoidal jitter, and frequency offset. Some simulation results are presented.",
  address="IEEE",
  booktitle="Proceedings of 2013 IEEE Fourth Latin American Symposium on Circuits and Systems (LASCAS 2013)",
  chapter="102778",
  doi="10.1109/LASCAS.2013.6519045",
  howpublished="electronic, physical medium",
  institution="IEEE",
  year="2013",
  month="february",
  pages="1--4",
  publisher="IEEE",
  type="conference paper"
}