Detail publikace

Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells

ŠICNER, J. MACKŮ, R. KOKTAVÝ, P. HOLCMAN, V.

Originální název

Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Paper deals with diagnostics of crystalline silicon solar cells with structures prepared by application of laser technologies. These laser-generated structures should help to isolate the edges of solar cells and also should isolate bulk defects. At the present we are trying to find the optimal parameters of laser processing. Laser parameters influencing how deep the laser notch is realized. We tried to determine what depth of the notch seems to be an ideal. Noise diagnostic methods are used for our study. These methods are based on the study of electrically measurable fluctuation quantities, especially electrical voltage and current, complemented by the transport characteristics. Electrical models describing behaviour of laser-prepared structures were put forward. The study of optical near-field and far-field will be also realized. Measurement of local radiation from solar cells during electrical excitation were carried out.

Klíčová slova

solar cell; laser notches; noise; defects

Klíčová slova v angličtině

solar cell; laser notches; noise; defects

Autoři

ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.; HOLCMAN, V.

Rok RIV

2013

Vydáno

28. 6. 2013

Místo

Montpellier

ISBN

978-1-4799-0670-3

Kniha

2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB

Strany od

1

Strany do

4

Strany počet

4

BibTex

@inproceedings{BUT101555,
  author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý} and Vladimír {Holcman}",
  title="Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells",
  booktitle="2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB",
  year="2013",
  pages="1--4",
  address="Montpellier",
  isbn="978-1-4799-0670-3"
}