Detail publikace

The Aperture with Laval Nozzle in Secondary Electron Detector for Environmental Scanning Electron Microscopy

VYROUBAL, P. MAXA, J.

Originální název

The Aperture with Laval Nozzle in Secondary Electron Detector for Environmental Scanning Electron Microscopy

Typ

kapitola v knize

Jazyk

angličtina

Originální abstrakt

Electron microscopes belong between the most versatile devices. They are used not only for material research as well as to providing comprehensive information on the microstructure, crystallography, chemical composition and other properties of the sample. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter by design of scintillation detector of secondary electrons. The final process is influenced by the size and the shape of the apertures used to separate areas with different pressure gradient. The comparison of the aperture with circular hole and aperture with Laval nozzle is the aim of this article.

Klíčová slova

Aperture, Laval nozzle, circular hole, Environmental scanning electron microscope, scintillation detector, trajectory of secondary electrons, Mach number, pressure.

Autoři

VYROUBAL, P.; MAXA, J.

Rok RIV

2013

Vydáno

1. 2. 2013

Nakladatel

Silhavy sro (Scientfic Press)

Místo

Vsetín 2012

ISBN

978-80-904741-2-3

Kniha

Computer Software and Hardware Applications

Edice

1

Číslo edice

1

Strany od

87

Strany do

95

Strany počet

9

BibTex

@inbook{BUT97695,
  author="Petr {Vyroubal} and Jiří {Maxa}",
  title="The Aperture with Laval Nozzle in Secondary Electron Detector for Environmental Scanning Electron Microscopy",
  booktitle="Computer Software and Hardware Applications",
  year="2013",
  publisher="Silhavy sro (Scientfic Press)",
  address="Vsetín 2012",
  series="1",
  edition="1",
  pages="87--95",
  isbn="978-80-904741-2-3"
}