Detail publikace

MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS

ŠICNER, J. MACKŮ, R. KOKTAVÝ, P.

Originální název

MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This article deals with local defects (fractures) on edges of silicon solar cells. We observed a particular type of structural defects by an electron microscope. These defects can be regarded as surface texturization breaks. Specimens including this type of local defects have been put under investigation. We study weak radiation generated from reverse-biased defect active area by means of a photomultiplier and a scientific CCD camera. This approach proves to be useful to measure micro-scale surface imperfections and fractures. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could affect larger regions compared to micro-scale defects.

Klíčová slova

solar cell, local defect, fractured surface, CCD camera

Autoři

ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.

Rok RIV

2012

Vydáno

11. 10. 2012

Nakladatel

Litera

Místo

Brno

ISBN

978-80-214-4594-9

Kniha

New trends in physics Proceedings of the conference

Číslo edice

1

Strany od

73

Strany do

76

Strany počet

4

BibTex

@inproceedings{BUT95958,
  author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý}",
  title="MICRO - SIZED LOCAL DEFECTS ON THE EDGE OF SILICON SOLAR CELLS AND THEIR OPTICAL AND THERMAL CHARACTERISTICS",
  booktitle="New trends in physics Proceedings of the conference",
  year="2012",
  number="1",
  pages="73--76",
  publisher="Litera",
  address="Brno",
  isbn="978-80-214-4594-9"
}