Detail publikace

Microholes on the silicon solar cell surface

ŠKARVADA, P. TOMÁNEK, P.

Originální název

Microholes on the silicon solar cell surface

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Local defects of optoelectronic devices with pn junction affect parameters of whole devices and their quality. For the defects localization purposes the emission of photons from reverse biased devices can be used. Actual results turns out, that those particular light emitting centers can have different physical nature. Some of these defects have indisputable connection with surface morphology, however some not, which makes localization more difficult. In this paper only microholes are investigated. Microscopic localization is not elementary due to small defect size (in submicron range) and low emission intensity. Experimental results are shown and discussed.

Klíčová slova

Solar cell defects, microscopy characterization

Autoři

ŠKARVADA, P.; TOMÁNEK, P.

Rok RIV

2012

Vydáno

12. 10. 2012

Nakladatel

Litera Brno

Místo

Brno

ISBN

978-80-214-4594-9

Kniha

New trends in physics 2012

Číslo edice

I

Strany od

165

Strany do

168

Strany počet

4

BibTex

@inproceedings{BUT94823,
  author="Pavel {Škarvada} and Pavel {Tománek}",
  title="Microholes on the silicon solar cell surface",
  booktitle="New trends in physics 2012",
  year="2012",
  number="I",
  pages="165--168",
  publisher="Litera Brno",
  address="Brno",
  isbn="978-80-214-4594-9"
}