Detail publikace

Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes

Originální název

Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes

Anglický název

Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes

Jazyk

en

Originální abstrakt

The use of non-destructive characterization methods has become essential for materials science, since it provides indispensable feedback and therefore helps to improve technology process. This paper reports the results obtained from an experimental piece of composite cold-field emission cathode based on tungsten metal-oxide structure, which was additionally coated by thin film of epoxy. Three various techniques have been used to describe structure of the material since the cathode is composed of structurally-various layers. Firstly, the energy dispersive spectroscopy (SEM-EDS) was used to find out which elements are present on the surface of the cathode. Secondly, the surface was examined by the means of scanning low-energy electron microscopy (SLEEM) which was applied in order to visualize the crystalline microstructure of the cathode surface. And finally, dielectric relaxation spectroscopy (DRS) has been used to characterize and measure the dielectric properties of the epoxy coating.

Anglický abstrakt

The use of non-destructive characterization methods has become essential for materials science, since it provides indispensable feedback and therefore helps to improve technology process. This paper reports the results obtained from an experimental piece of composite cold-field emission cathode based on tungsten metal-oxide structure, which was additionally coated by thin film of epoxy. Three various techniques have been used to describe structure of the material since the cathode is composed of structurally-various layers. Firstly, the energy dispersive spectroscopy (SEM-EDS) was used to find out which elements are present on the surface of the cathode. Secondly, the surface was examined by the means of scanning low-energy electron microscopy (SLEEM) which was applied in order to visualize the crystalline microstructure of the cathode surface. And finally, dielectric relaxation spectroscopy (DRS) has been used to characterize and measure the dielectric properties of the epoxy coating.

BibTex


@inproceedings{BUT94644,
  author="Evgeny {Sergeev} and Alexandr {Knápek} and Šárka {Mikmeková} and Lubomír {Grmela} and Marián {Klampár}",
  title="Material Characterization of the Epoxy-Coated Cold-Field-Emission Cathodes",
  annote="The use of non-destructive characterization methods has become essential for materials science, since it provides indispensable feedback and therefore helps to improve technology process. This paper reports the results obtained from an experimental piece of composite cold-field emission cathode based on tungsten metal-oxide structure, which was additionally coated by thin film of epoxy. Three various techniques have been used to describe structure of the material since the cathode is composed of structurally-various layers. Firstly, the energy dispersive spectroscopy (SEM-EDS) was used to find out which elements are present on the surface of the cathode. Secondly, the surface was examined by the means of scanning low-energy electron microscopy (SLEEM) which was applied in order to visualize the crystalline microstructure of the cathode surface. And finally, dielectric relaxation spectroscopy (DRS) has been used to characterize and measure the dielectric properties of the epoxy coating.",
  booktitle="Proceedings of the Scientific Conference Physics of Materials 2012",
  chapter="94644",
  edition="první",
  howpublished="print",
  year="2012",
  month="october",
  pages="109--112",
  type="conference paper"
}