Detail publikace

The effect of silver diffusion from contact electrode into thick film resistors

SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.

Originální název

The effect of silver diffusion from contact electrode into thick film resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

Klíčová slova v angličtině

Noise, Non-linearity, Thick film

Autoři

SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

Electronic Components Institute Internationale Ltd.

Místo

United Kingdom

ISBN

0887-7491

Kniha

CARTS - EUROPE 2003 Proceedings

Strany od

201

Strany do

204

Strany počet

4

BibTex

@inproceedings{BUT9064,
  author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}",
  title="The effect of silver diffusion from contact electrode into thick film resistors",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  year="2003",
  pages="4",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="United Kingdom",
  isbn="0887-7491"
}