Detail publikace

Detection of Backscattered Electrons in Environmental Scaning Electron Microscope

AUTRATA, R., JIRÁK, J., WANDROL, P., ŠPINKA, J.

Originální název

Detection of Backscattered Electrons in Environmental Scaning Electron Microscope

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector.

Klíčová slova v angličtině

backscattered, electron, environmental, scanning, microscope

Autoři

AUTRATA, R., JIRÁK, J., WANDROL, P., ŠPINKA, J.

Vydáno

1. 6. 2003

Místo

Pula, Croatia

Strany od

489

Strany do

490

Strany počet

2

BibTex

@inproceedings{BUT8590,
  author="Rudolf {Autrata} and Josef {Jirák} and Petr {Wandrol} and Jiří {Špinka}",
  title="Detection of Backscattered Electrons in Environmental Scaning Electron Microscope",
  booktitle="Proceedings 6th Multinational Congress on Microscopy",
  year="2003",
  number="1",
  pages="2",
  address="Pula, Croatia"
}