Detail publikace

Microelectronic structure reliability evaluation using response surface methodology

NOVOTNÝ, R.

Originální název

Microelectronic structure reliability evaluation using response surface methodology

Anglický název

Microelectronic structure reliability evaluation using response surface methodology

Jazyk

en

Originální abstrakt

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

Anglický abstrakt

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

Dokumenty

BibTex


@inproceedings{BUT8375,
  author="Radovan {Novotný}",
  title="Microelectronic structure reliability evaluation using response surface methodology",
  annote="The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.",
  address="Zdeněk Novotný",
  booktitle="10th Electronic Devices and Systems Conference 2003",
  chapter="8375",
  institution="Zdeněk Novotný",
  year="2003",
  month="january",
  pages="166",
  publisher="Zdeněk Novotný",
  type="conference paper"
}