Detail publikace

Microscopic Analysis of Chips

Originální název

Microscopic Analysis of Chips

Anglický název

Microscopic Analysis of Chips

Jazyk

en

Originální abstrakt

Nowadays many different types of chips are used virtually everywhere in the real world. Sometimes, it is necessary to ensure that a certain chip meets specific requirements. For this reason, it is essential to examine various properties of chips; one of those can be, e.g., the chip security with respect to its physical structure. This paper provides description of a proven chip decapsulation process (the presented process can be used to obtain bare chips for further analysis) and some additional information concerning analysis of the chips. Finally, a prototype of our application designated for later semiautomatic analysis is also briefly presented.

Anglický abstrakt

Nowadays many different types of chips are used virtually everywhere in the real world. Sometimes, it is necessary to ensure that a certain chip meets specific requirements. For this reason, it is essential to examine various properties of chips; one of those can be, e.g., the chip security with respect to its physical structure. This paper provides description of a proven chip decapsulation process (the presented process can be used to obtain bare chips for further analysis) and some additional information concerning analysis of the chips. Finally, a prototype of our application designated for later semiautomatic analysis is also briefly presented.

BibTex


@inproceedings{BUT76499,
  author="Dominik {Malčík} and Martin {Drahanský}",
  title="Microscopic Analysis of Chips",
  annote="Nowadays many different types of chips are used virtually everywhere in the real
world. Sometimes, it is necessary to ensure that a certain chip meets specific
requirements. For this reason, it is essential to examine various properties of
chips; one of those can be, e.g., the chip security with respect to its physical
structure. This paper provides description of a proven chip decapsulation process
(the presented process can be used to obtain bare chips for further analysis) and
some additional information concerning analysis of the chips. Finally,
a prototype of our application designated for later semiautomatic analysis is
also briefly presented.",
  address="Springer Verlag",
  booktitle="Security Technology",
  chapter="76499",
  doi="10.1007/978-3-642-27189-2_12",
  edition="Communications in Computer and Information Science",
  howpublished="print",
  institution="Springer Verlag",
  year="2011",
  month="december",
  pages="113--122",
  publisher="Springer Verlag",
  type="conference paper"
}