Detail publikace

Microscale comparison of solar cell recombination centers

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P.

Originální název

Microscale comparison of solar cell recombination centers

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.

Klíčová slova

solar cell, defects

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.

Rok RIV

2011

Vydáno

27. 6. 2011

Nakladatel

ZČU

Místo

Plzeň

ISSN

1802-4564

Periodikum

ElectroScope - http://www.electroscope.zcu.cz

Ročník

2011

Číslo

4

Stát

Česká republika

Strany od

25

Strany do

28

Strany počet

4

BibTex

@article{BUT75327,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý}",
  title="Microscale comparison of solar cell recombination centers",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2011",
  volume="2011",
  number="4",
  pages="25--28",
  issn="1802-4564"
}