Detail publikace

Local measurement of solar cell emission characteristics

ŠKARVADA, P. TOMÁNEK, P. GRMELA, L.

Originální název

Local measurement of solar cell emission characteristics

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.

Klíčová slova

solar cell, defect characterization, light emission

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.

Rok RIV

2011

Vydáno

1. 11. 2011

Nakladatel

SPIE

Místo

USA

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

8036

Číslo

8306

Stát

Spojené státy americké

Strany od

1H1

Strany do

1H6

Strany počet

6