Detail publikace

Carrier Bulk-Lifetime Measurement during Solar Cell Production

SOLČANSKÝ, M. VANĚK, J.

Originální název

Carrier Bulk-Lifetime Measurement during Solar Cell Production

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

The main material parameter of silicon is the minority carrier bulk lifetime and influences the effectiveness of photovoltaic cells. It may change in the technological process especially during high temperature operations. Monitoring of the carrier bulk-lifetime is necessary for modifying the whole technological process of production. This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution remains from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development.

Klíčová slova

chemical passivation, quinhydrone, bulk-lifetime

Autoři

SOLČANSKÝ, M.; VANĚK, J.

Rok RIV

2011

Vydáno

1. 11. 2011

ISSN

1802-4564

Periodikum

ElectroScope - http://www.electroscope.zcu.cz

Ročník

2011

Číslo

4

Stát

Česká republika

Strany od

1

Strany do

4

Strany počet

4

BibTex

@article{BUT74134,
  author="Marek {Solčanský} and Jiří {Vaněk}",
  title="Carrier Bulk-Lifetime Measurement during Solar Cell Production",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2011",
  volume="2011",
  number="4",
  pages="1--4",
  issn="1802-4564"
}