Detail publikace

Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments

KOČIŠEK, J. STRUŽÍNSKÝ, O. SAHÁNKOVÁ, H. KRČMA, F. MATEJČÍK, Š.

Originální název

Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments

Anglický název

Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments

Jazyk

en

Originální abstrakt

Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron-molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 +- 0.06eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basis of experimental observations. The detection of doubly charged ions of DMPS2+ (AE=26.3 +- eV) as well as several other doubly charged fragments is discussed in detail.

Anglický abstrakt

Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron-molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 +- 0.06eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basis of experimental observations. The detection of doubly charged ions of DMPS2+ (AE=26.3 +- eV) as well as several other doubly charged fragments is discussed in detail.

Dokumenty

BibTex 


@article{BUT74088,
  author="Jaroslav {Kočišek} and Ondřej {Stružínský} and Hana {Sahánková} and František {Krčma} and Štefan {Matejčík}",
  title="Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments",
  annote="Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron-molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 +- 0.06eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basis of experimental observations. The detection of doubly charged ions of DMPS2+ (AE=26.3 +- eV) as well as several other doubly charged fragments is discussed in detail.",
  chapter="74088",
  number="3",
  volume="9",
  year="2012",
  month="march",
  pages="298--303",
  type="journal article - other"
}